Jv

JT van Linden

6 records found

Test point insertion that facilitates ATPG in reducing test time and data volume

Facilitating automatic test pattern generators using test point insertion

Test point insertion for compact test sets

Fault (in)dependent cost estimates and conflict-directed backtracking to guide sequential circuit test generation

Illegal state space identification for sequential circuit test generation

Testability of the Philips 80C51 micro-controller