Jv

JT van Linden

6 records found

Authored

Test point insertion that facilitates ATPG in reducing test time and data volume
Conference paper (2002) - MJ Geuzebroek, JT van Linden, AJ van de Goor

Facilitating automatic test pattern generators using test point insertion

Test point insertion for compact test sets
Conference paper (2000) - MJ Geuzebroek, JT van Linden, AJ van de Goor Ph D

Testability of the Philips 80C51 micro-controller
Conference paper (1999) - MH Konijnenburg, JT van Linden, AJ van de Goor Ph D

Fault (in)dependent cost estimates and conflict-directed backtracking to guide sequential circuit test generation
Conference paper (1999) - MH Konijnenburg, JT van Linden, AJ van de Goor Ph D

Illegal state space identification for sequential circuit test generation
Conference paper (1999) - MH Konijnenburg, JT van Linden, AJ van de Goor Ph D