Fault (in)dependent cost estimates and conflict-directed backtracking to guide sequential circuit test generation

Conference paper (1999)

Authors

MH Konijnenburg External organisation
JT van Linden Computer Engineering - EEMCS
AJ van de Goor Ph D External organisation
Research Group
Computer Engineering (EEMCS) (TU Delft)
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Published Date

1999

Language

Undefined/Unknown

Reuse Rights

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Faculty

Electrical Engineering, Mathematics and Computer Science

Department

Quantum & Computer Engineering

Research Group

Computer Engineering