Test point insertion to improve BIST performance and to reduce ATPG test time and data volume

Doctoral thesis (2003)

Authors

MJ Geuzebroek Computer Engineering - EEMCS
Research Group
Computer Engineering (EEMCS) (TU Delft)
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Published Date

2003

Language

Undefined/Unknown

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Faculty

Electrical Engineering, Mathematics and Computer Science

Department

Quantum & Computer Engineering

Research Group

Computer Engineering