AL
A. Liu
2 records found
1
Bachelor thesis
(2022)
-
A.
Liu
(author),
J. H.
Krijthe
(mentor),
J.H.
Krijthe
(mentor),
JH
Krijthe
(mentor),
Jesse
Krijthe
(mentor),
Jesse H.
Krijthe
(mentor),
Rickard
Karlsson
(mentor),
R.K.A.
Karlsson
(mentor),
S.R.
Bongers
(mentor),
T.
Höllt
(graduation committee member),
T.
Hollt
(graduation committee member),
Thomas
Höllt
(graduation committee member),
Thomas
Hollt
(graduation committee member),
Thomas
Hollt
(graduation committee member),
Thomas
Höllt
(graduation committee member)
Out-of-domain (OOD) generalization refers to learning a model from one or more different but related domain(s) that can be used in an unknown test domain. It is challenging for existing machine learning models. Several methods have been proposed to solve this problem, and multi-d
...
Out-of-domain (OOD) generalization refers to learning a model from one or more different but related domain(s) that can be used in an unknown test domain. It is challenging for existing machine learning models. Several methods have been proposed to solve this problem, and multi-domain calibration is one of these methods. Model selection with the average expected calibration error (ECE) across training domains and naive calibration are two approaches to implementing multi-domain calibration. However, it might happen that neither approach can learn a genuinely well-calibrated model in the multi-domain setting. Hence, this paper intends to evaluate how naive calibration and model selection with average ECE perform in the OOD generalization problem for binary classifiers. We generated many synthetic datasets and set up three experiments to answer this question. Finally, the conclusions based on empirical results are obtained: 1) Although naive calibration can improve the average accuracy across unseen domains (OOD accuracy) and the average area under the ROC Curve across unseen domains (OOD AUROC) for some binary classifiers, it does not work for all binary classifiers. However, at least it does not make the model worse for OOD generalization. 2) On the synthetic datasets we generated, if the number of training domains increases, most binary classifiers' OOD accuracy will also increase. 3) Average ECE is a reasonable metric for selecting a model in the OOD generalization problem and is better than validation accuracy. This is because a strong linear relationship exists between OOD accuracy and the average ECE across the training domains. This linear relationship is stronger than the linear relationship between OOD accuracy and validation accuracy.
Journal article
(2010)
-
B.C.
Arnold
(author),
B.C.
Arnold
(author),
G
Chen
(author),
G
Chen
(author),
D.
Kong
(author),
D.
Kong
(author),
H.
Park
(author),
H.
Park
(author),
D.
Son
(author),
D.
Son
(author),
S.
SONG
(author),
S.
SONG
(author),
S.
Jung
(author),
S.
Jung
(author),
B.C.
Hong
(author),
B.C.
Hong
(author),
H.
Kim
(author),
H.
Kim
(author),
J.H.
Kim
(author),
J.H.
Kim
(author),
K.S.
Lee
(author),
K.S.
Lee
(author),
S.
Park
(author),
S.
Park
(author),
H
Chen
(author),
H
Chen
(author),
J.
Kim
(author),
J.
Kim
(author),
M.
Choi
(author),
M.
Choi
(author),
G.
Hahn
(author),
G.
Hahn
(author),
S.
Choi
(author),
S.
Choi
(author),
YH
Choi
(author),
YH
Choi
(author),
J.L.
Goh
(author),
J.L.
Goh
(author),
H.
Jeong
(author),
H.
Jeong
(author),
T.
Kim
(author),
T.
Kim
(author),
J
Lee
(author),
J
Lee
(author),
S
Lee
(author),
S
Lee
(author),
C.
Jiang
(author),
C.
Jiang
(author),
Chenpeng
Jiang
(author),
Chenpeng
Jiang
(author),
Chengpeng
Jiang
(author),
Chengpeng
Jiang
(author),
P.I.
Petrov
(author),
P.I.
Petrov
(author),
J.
Williams
(author),
J.
Williams
(author),
M.
Ahmad
(author),
M.
Ahmad
(author),
M.
Ahmad
(author),
I.
Ahmed
(author),
I.
Ahmed
(author),
I.
Ahmed
(author),
M.S.
Asghar
(author),
M.S.
Asghar
(author),
M.S.
Asghar
(author),
M.A.A.
Awan
(author),
M.A.A.
Awan
(author),
M.A.A.
Awan
(author),
I.
Hussain
(author),
I.
Hussain
(author),
I.
Hussain
(author),
M.W.
Khan
(author),
M.W.
Khan
(author),
M.W.
Khan
(author),
S.
Muhammad
(author),
S.
Muhammad
(author),
S.
Muhammad
(author),
H.
Shahzad
(author),
H.
Shahzad
(author),
H.
Shahzad
(author),
D.
Liang
(author),
D.
Liang
(author),
P.M.
Zalewski
(author),
P.M.
Zalewski
(author),
A.E.
David
(author),
A.E.
David
(author),
P
Ribeiro
(author),
P
Ribeiro
(author),
P
Ribeiro
(author),
P
Ribeiro
(author),
PGR
Silva
(author),
PGR
Silva
(author),
PGR
Silva
(author),
PGR
Silva
(author),
M.
Finger
(author),
M.
Finger
(author),
M
Finger
(author),
M
Finger
(author),
M
Finger
(author),
M
Finger
(author),
M.
Finger
(author),
M.
Finger
(author),
A.
Denisov
(author),
A.
Denisov
(author),
V.
Kim
(author),
V.
Kim
(author),
A.
Anisimov
(author),
A.
Anisimov
(author),
A. G.
Anisimov
(author),
A. G.
Anisimov
(author),
Andrei G.
Anisimov
(author),
Andrei G.
Anisimov
(author),
A.J.
Levine
(author),
A.J.
Levine
(author),
B.
Liu
(author),
B.
Liu
(author),
V.
Petrov
(author),
V.
Petrov
(author),
M.
Daniël
(author),
M.
Daniël
(author),
J.I.
Hernandez
(author),
J.I.
Hernandez
(author),
J.I.
Hernández
(author),
J.I.
Hernández
(author),
Jose Ignacio
Hernández
(author),
Jose Ignacio
Hernández
(author),
Jose Ignacio
Hernandez
(author),
Jose Ignacio
Hernandez
(author),
José Ignacio
Hernandez
(author),
José Ignacio
Hernandez
(author),
José Ignacio
Hernández
(author),
José Ignacio
Hernández
(author),
B.
Gómez
(author),
B.
Gómez
(author),
J.
Bos
(author),
J.
Bos
(author),
D.
Campi
(author),
D.
Campi
(author),
M.
Hansen
(author),
M.
Hansen
(author),
J.
Harvey
(author),
J.
Harvey
(author),
H.
Hoffmann
(author),
H.
Hoffmann
(author),
R.J.
Loos
(author),
R.J.
Loos
(author),
X
Meng
(author),
X
Meng
(author),
F.E.
Meijers
(author),
F.E.
Meijers
(author),
M.
Mulders
(author),
M.
Mulders
(author),
L.
Orsini
(author),
L.
Orsini
(author),
E
Perez
(author),
E
Perez
(author),
A.
Sharma
(author),
A.
Sharma
(author),
S.
König
(author),
S.
König
(author),
F.A.
Meier
(author),
F.A.
Meier
(author),
Z.
Chen
(author),
Z.
Chen
(author),
A.J.H.
Herve
(author),
A.J.H.
Herve
(author),
A.
Sanchez
(author),
A.
Sanchez
(author),
J.
Tao
(author),
J.
Tao
(author),
M.
Weber
(author),
M.
Weber
(author),
A.
Schmidt
(author),
A.
Schmidt
(author),
Y.
Chang
(author),
Y.
Chang
(author),
E.
Chen
(author),
E.
Chen
(author),
W.
Chen
(author),
W.
Chen
(author),
A.C.S.
Go
(author),
A.C.S.
Go
(author),
C.
Kuo
(author),
C.
Kuo
(author),
S
Li
(author),
S
Li
(author),
W
Lin
(author),
W
Lin
(author),
P.L.T.
Chang
(author),
P.L.T.
Chang
(author),
J
Wang
(author),
J
Wang
(author),
Y.
Chao
(author),
Y.
Chao
(author),
K.
Chen
(author),
K.
Chen
(author),
Kewang
Chen
(author),
Kewang
Chen
(author),
Y.
Lei
(author),
Y.
Lei
(author),
S.
Lin
(author),
S.
Lin
(author),
R.
Lu
(author),
R.
Lu
(author),
J
Schumann
(author),
J
Schumann
(author),
J
Schumann
(author),
J
Schumann
(author),
C.C.
Wang
(author),
C.C.
Wang
(author),
Charlie C.L.
Wang
(author),
Charlie C.L.
Wang
(author),
Charlie
Wang
(author),
Charlie
Wang
(author),
Meng
Wang
(author),
Meng
Wang
(author),
M.
Wang
(author),
M.
Wang
(author),
M.
Kaya
(author),
M.
Kaya
(author),
M.
Kaya
(author),
M.
Kaya
(author),
Mesut
Kaya
(author),
Mesut
Kaya
(author),
Mesut
Kaya
(author),
Mesut
Kaya
(author),
M.O.
Kaya
(author),
M.O.
Kaya
(author),
M.O.
Kaya
(author),
M.O.
Kaya
(author),
Z
Wang
(author),
Z
Wang
(author),
N.O.
Sonmez
(author),
N.O.
Sonmez
(author),
N.O.
Sonmez
(author),
N.O.
Sonmez
(author),
T.O.C.
Cheng
(author),
T.O.C.
Cheng
(author),
M.
Hansen
(author),
M.
Hansen
(author),
RR
Brown
(author),
RR
Brown
(author),
J.
Williams
(author),
J.
Williams
(author),
J.P.
Hays
(author),
J.P.
Hays
(author),
A.
Papageorgiou
(author),
A.
Papageorgiou
(author),
A.V.
Rose
(author),
A.V.
Rose
(author),
A.
Khan
(author),
A.
Khan
(author),
R.E.
Taylor
(author),
R.E.
Taylor
(author),
Z.
Xue
(author),
Z.
Xue
(author),
J.
Rohlf
(author),
J.
Rohlf
(author),
S
Wu
(author),
S
Wu
(author),
S.
Bhattacharya
(author),
S.
Bhattacharya
(author),
D.C.C.
Nguyen
(author),
D.C.C.
Nguyen
(author),
P.
Cox
(author),
P.
Cox
(author),
H
Liu
(author),
H
Liu
(author),
M.
Nikolic
(author),
M.
Nikolic
(author),
J.N.V.
Smith
(author),
J.N.V.
Smith
(author),
M.
Tripathi
(author),
M.
Tripathi
(author),
J.H.C.
Hauser
(author),
J.H.C.
Hauser
(author),
Sonja
Schmid
(author),
Sonja
Schmid
(author),
S.
Schmid
(author),
S.
Schmid
(author),
Z.
Zhang
(author),
Z.
Zhang
(author),
X.
Yang
(author),
X.
Yang
(author),
A.
Chandra
(author),
A.
Chandra
(author),
F.
LIU
(author),
F.
LIU
(author),
H
Liu
(author),
H
Liu
(author),
A.
Luthra
(author),
A.
Luthra
(author),
H.
Nguyen
(author),
H.
Nguyen
(author),
B.
Shen
(author),
B.
Shen
(author),
V.
Sharma
(author),
V.
Sharma
(author),
S.C.
Simon
(author),
S.C.
Simon
(author),
Y.
Ma
(author),
Y.
Ma
(author),
J.
Cai
(author),
J.
Cai
(author),
Y.
Yang
(author),
Y.
Yang
(author),
L
Zhang
(author),
L
Zhang
(author),
K.
Zhu
(author),
K.
Zhu
(author),
Kailun
Zhu
(author),
Kailun
Zhu
(author),
R.
Zhu
(author),
R.
Zhu
(author),
B.
Akgün
(author),
B.
Akgün
(author),
S.
Wagner
(author),
S.
Wagner
(author),
A.
Chatterjee
(author),
A.
Chatterjee
(author),
A.
Chatterjee
(author),
Anasua
Chatterjee
(author),
Anasua
Chatterjee
(author),
Anasua
Chatterjee
(author),
S.
Das
(author),
S.
Das
(author),
B.A.
Kreis
(author),
B.A.
Kreis
(author),
VB
Kuznetsov
(author),
VB
Kuznetsov
(author),
VB
Kuznetsov
(author),
VB
Kuznetsov
(author),
Y.
GE
(author),
Y.
GE
(author),
X.
Shi
(author),
X.
Shi
(author),
Wenbo
Sun
(author),
Wenbo
Sun
(author),
W.
Sun
(author),
W.
Sun
(author),
W.Y.
Teo
(author),
W.Y.
Teo
(author),
Y.
Weng
(author),
Y.
Weng
(author),
S.
Banerjee
(author),
S.
Banerjee
(author),
P.
Bhat
(author),
P.
Bhat
(author),
J.G.
Butler
(author),
J.G.
Butler
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H.Y.
Cheung
(author),
H.Y.
Cheung
(author),
D.M.J.
Dykstra
(author),
D.M.J.
Dykstra
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L.
Feng
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L.
Feng
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S.
GUO
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S.
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Y.
Guo
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M.K.P.
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M.K.P.
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C.
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C.
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(author),
J.
Kaiser
(author),
J.
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(author),
C.O.S.
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(author),
C.O.S.
Lei
(author),
S.A.
Los
(author),
S.A.
Los
(author),
K.A.
Mishra
(author),
K.A.
Mishra
(author),
R.V.
Rivera
(author),
R.V.
Rivera
(author),
S.
Ryu
(author),
S.
Ryu
(author),
Shubham
Sharma
(author),
Shubham
Sharma
(author),
S.
Sharma
(author),
S.
Sharma
(author),
Z.
Hu
(author),
Z.
Hu
(author),
R.
Smith
(author),
R.
Smith
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R.A.
Vidal
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R.A.
Vidal
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W.
Wu
(author),
W.
Wu
(author),
J.
Yun
(author),
J.
Yun
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M
Chen
(author),
M
Chen
(author),
Y.
Fu
(author),
Y.
Fu
(author),
J.
Gartner
(author),
J.
Gartner
(author),
Johannes
Gartner
(author),
Johannes
Gartner
(author),
B.
Kim
(author),
B.
Kim
(author),
D.
Wang
(author),
D.
Wang
(author),
L.
Kramer
(author),
L.
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(author),
Y.
Mao
(author),
Y.
Mao
(author),
J.L.
Rodriguez
(author),
J.L.
Rodriguez
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M
Bertoldi
(author),
M
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J
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J
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J.
Haas
(author),
J.
Haas
(author),
K.
Johnson
(author),
K.
Johnson
(author),
M.G.A.
Adams
(author),
M.G.A.
Adams
(author),
MC
Castro
(author),
MC
Castro
(author),
D.
Hofman
(author),
D.
Hofman
(author),
E.
Albayrak
(author),
E.
Albayrak
(author),
RO
Briggs
(author),
RO
Briggs
(author),
RO
Briggs
(author),
RO
Briggs
(author),
S
Qian
(author),
S
Qian
(author),
L.F.K.
Chung
(author),
L.F.K.
Chung
(author),
I
Schmidt
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I
Schmidt
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S.
Sen
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S.
Sen
(author),
J.
Wetzel
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J.
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K.W.A.
Yi
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K.W.A.
Yi
(author),
Z.
Guo
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Z.
Guo
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N.Q.
Tran
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N.Q.
Tran
(author),
Y
Zhang
(author),
Y
Zhang
(author),
S.J.
Sanders
(author),
S.J.
Sanders
(author),
T.K.
Bolton
(author),
T.K.
Bolton
(author),
H.H.
Teng
(author),
H.H.
Teng
(author),
A.
Liu
(author),
A.
Liu
(author),
Z.
Wan
(author),
Z.
Wan
(author),
D.J.
Wright
(author),
D.J.
Wright
(author),
G.
Bauer
(author),
G.
Bauer
(author),
M.
Chan
(author),
M.
Chan
(author),
Michael
Chan
(author),
Michael
Chan
(author),
Y.
Kim
(author),
Y.
Kim
(author),
Y.
Lee
(author),
Y.
Lee
(author),
W
Li
(author),
W
Li
(author),
T.
Ma
(author),
T.
Ma
(author),
M.
Rudolph
(author),
M.
Rudolph
(author),
B.
Zhu
(author),
B.
Zhu
(author),
Zhu
Zhu
(author),
Zhu
Zhu
(author),
B.
Baozhou
(author),
B.
Baozhou
(author),
Zhu
Baozhou
(author),
Zhu
Baozhou
(author),
Baozhou
Baozhou
(author),
Baozhou
Baozhou
(author),
Baozhou
Zhu
(author),
Baozhou
Zhu
(author),
S.
Xie
(author),
S.
Xie
(author),
A.
Yoon
(author),
A.
Yoon
(author),
J.H.A.
Mans
(author),
J.H.A.
Mans
(author),
J
Zhang
(author),
J
Zhang
(author),
D.
Sanders
(author),
D.
Sanders
(author),
D.
Claes
(author),
D.
Claes
(author),
J.
Keller
(author),
J.
Keller
(author),
S.
Malik
(author),
S.
Malik
(author),
A.
Kumar
(author),
A.
Kumar
(author),
A.
Kumar
(author),
A.
Kumar
(author),
A
Kumar
(author),
A
Kumar
(author),
A
Kumar
(author),
A
Kumar
(author),
K.L.
Smith
(author),
K.L.
Smith
(author),
A.M.
Gomez
(author),
A.M.
Gomez
(author),
L.I.P.
Taylor
(author),
L.I.P.
Taylor
(author),
S.
Won
(author),
S.
Won
(author),
D.K.
Berry
(author),
D.K.
Berry
(author),
J.
Gu
(author),
J.
Gu
(author),
G.F.
Williams
(author),
G.F.
Williams
(author),
N.J.
Adam
(author),
N.J.
Adam
(author),
Andres
Hunt
(author),
Andres
Hunt
(author),
A.
Hunt
(author),
A.
Hunt
(author),
J.C.
Jones
(author),
J.C.
Jones
(author),
E.A.
Laird
(author),
E.A.
Laird
(author),
M.T.
Mooney
(author),
M.T.
Mooney
(author),
A
Fedorov
(author),
A
Fedorov
(author),
A
Fedorov
(author),
A
Fedorov
(author),
A. K.
Fedorov
(author),
A. K.
Fedorov
(author),
A. K.
Fedorov
(author),
A. K.
Fedorov
(author),
A.K.
Hektor
(author),
A.K.
Hektor
(author),
J.M.M.
Werner
(author),
J.M.M.
Werner
(author),
Z.
Xie
(author),
Z.
Xie
(author),
X
Huang
(author),
X
Huang
(author),
A.J.M.
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Commissioning studies of the CMS hadron calorimeter have identified sporadic uncharacteristic noise and a small number of malfunctioning calorimeter channels. Algorithms have been developed to identify and address these problems in the data. The methods have been tested on cosmic
...
Commissioning studies of the CMS hadron calorimeter have identified sporadic uncharacteristic noise and a small number of malfunctioning calorimeter channels. Algorithms have been developed to identify and address these problems in the data. The methods have been tested on cosmic ray muon data, calorimeter noise data, and single beam data collected with CMS in 2008. The noise rejection algorithms can be applied to LHC collision data at the trigger level or in the offline analysis. The application of the algorithms at the trigger level is shown to remove 90% of noise events with fake missing transverse energy above 100 GeV, which is sufficient for the CMS physics trigger operation.
@en