OE

4 records found

One possible way of proving the famous and important Riemann hypothesis would be to realize the Riemann zeta zeroes as the eigenvalues of some self-adjoint operator, using self-adjointness to show that the non-trivial zeroes all lie on the critical line. This is known as the Hil ...
Scatterometry is a non-destructive metrology technique widely used in the semiconductor industry for the reconstruction of periodic structures from diffraction measurements. This involves solving a so-called inverse problem, which can be done by tuning the geometry parameters of ...
As demand for chips increases and critical dimension keeps shrinking, the inspection of wafer becomes one of the critical challenges in the high volume production of chips. Coherent Fourier scatterometry (CFS) is a scanning bright field technique that is capable to detect nanopar ...

Electromagnetic scattering beyond the weak regime

Solving the problem of divergent Born perturbation series by Padé approximants

In many optical measurement methods one aims to retrieve the shape or physical properties of an unknown object by measuring how it scatters an incident optical field. Such an inverse problem is often approached by solving the corresponding direct scattering problem iteratively. D ...