EO

E Oliviero

4 records found

Authored

Helium implantation defects in SiC: a thermal helium desorption spectrometry investigation
Journal article (2003) - E Oliviero, MF Beaufort, JF Barbot, A van Veen, AV Fedorov

Helium implantation in silicon: the effects of implantation temperature

On the effects of implantation temperature in helium implanted silicon
Journal article (2002) - E Oliviero, ML David, MF Beaufort, JF Barbot, A van Veen

Characterisation of defects in industrial silicon carbide (6H-SiC) by helium desorption techniques
Report (2001) - E Oliviero, KT Westerduin, A van Veen