V

VGM Sivel

30 records found

Authored

Anisotropic growth of chromium films during sputter deposition on substrates in planetary motion

Dielectric response of sputtered transition metal oxides

Electron backscattering diffraction of FIB prepared thin specimens

Tensile stress in hard metal films

Presence of aluminium in a FIB prepared TEM specimen made in a blister
Report (2003) - VGM Sivel

Electron backscattering diffraction on FIB prepared thin specimens

Tensile stress in hard metal films
Journal article (2003) - G.C.A.M. Janssen, AJ Dammers, VGM Sivel, WR Wang

Scratch test measurements of CrNx coatings

Tensile stress in hard metal films

Application of the dual beam focussed ion beam for metaks research

Scratch test measurements on CrNx coatings

Electron backscattering diffraction on FIB prepared thin specimens

Focused ion beam in an electron microscope

Cross section by focussed ion beam of in-situ induced phase transformed zones at grain boundaries in Cu3Au TEM foils

Zr oxide coating on Al-5000 alloys
Report (2003) - F.D. Tichelaar, VGM Sivel

Tensile stress in hard metal films

Investigation of ordering phenomena in the interstitial solid solutions e-Fe2N1-z and e-Fe2N by the Cluster Variation Method

Application of the Dual Beam FIB for crystallographic infection

Possibilities of the Dual Beam Focussed ion Beam

Applications of the Dual Beam Focused ion Beam