Crystallographic analysis of thin specimens

Sivel, VGM; Tichelaar, F.D.; Mohdadi, H; Alkemade, P.F.A.; Zandbergen, H.W.

Crystallographic analysis of thin specimens

Journal article (2005)

Authors

VGM Sivel QN/High Resolution Electron Microscopy

F.D. Tichelaar QN/High Resolution Electron Microscopy

H Mohdadi QN/High Resolution Electron Microscopy

P.F.A. Alkemade QN/High Resolution Electron Microscopy

H.W. Zandbergen QN/High Resolution Electron Microscopy

Research Group

QN/High Resolution Electron Microscopy

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Published Date

2005

Language

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Research Group

QN/High Resolution Electron Microscopy