R Sinclair | TU Delft Repository

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R Sinclair

Journal article (2)

2 records found

1

Atomic scale verification of oxide-ion vacancy distribution near a single grain boundary in YSZ

Journal article (2013) - J An (author), J Sun Park (author), A Leen Koh (author), HB Lee (author), H Joon Jung (author), J. Schoonman (author), J. Schoonman (author), Joop Schoonman (author), Joop Schoonman (author), J Schoonman (author), J Schoonman (author), R Sinclair (author), TM Gur (author), FB Prinz (author)

Approaching the limits of dielectric breakdown for SiO2 films deposited by plasma-enhanced atomic layer deposition

Journal article (2013) - T Usui (author), CA Donelly (author), M Logar (author), R Sinclair (author), Joop Schoonman (author), J. Schoonman (author), J Schoonman (author), FB Prinz (author)