Online Detection of Unique Faults in RRAMs

Conference paper (2024)

Authors

H. Xun Computer Engineering -

M. Fieback Computer Engineering -

Mohammad Amin Yaldagard Computer Engineering -

S. Yuan Computer Engineering -

Hassen Aziza Aix Marseille Université

M. Taouil Computer Engineering -

S. Hamdioui Computer Engineering -

Research Group

Computer Engineering () (TU Delft)

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Published Date

2024

Language

English

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Faculty

Electrical Engineering, Mathematics and Computer Science

Department

Quantum & Computer Engineering

Research Group

Computer Engineering

Abstract

Due to the immature manufacturing process, Resistive Random Access Memories (RRAMs) are prone to exhibit new failure mechanisms and faults, which should be efficiently detected for high-volume production. Those unique faults are hard to detect but require specific Design-for-Test (DfT) circuit design. This paper proposes a DfT based on a parallel-reference write circuit that can detect all RRAM array faults during diagnosis, production testing, and its application in the field.

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