Nanofabricated tips for device-based scanning tunneling microscopy

Journal article (2019)

Authors

M. Leeuwenhoek Universiteit Leiden, QN/Groeblacher Lab - AS , Kavli institute of nanoscience Delft
R.A. Norte Kavli institute of nanoscience Delft, QN/Groeblacher Lab - AS , Dynamics of Micro and Nano Systems - Mechanical, Maritime and Materials Engineering
K. M. Bastiaans Universiteit Leiden
Doohee Cho Universiteit Leiden
Irene Battisti Universiteit Leiden
Y.M. Blanter QN/Blanter Group - AS , Kavli institute of nanoscience Delft
S. Groeblacher QN/Groeblacher Lab - AS , Kavli institute of nanoscience Delft
Milan P. Allan Universiteit Leiden
Research Group
QN/Groeblacher Lab (AS) (TU Delft)
Copyright: © 2019 M. Leeuwenhoek, R.A. Norte, Koen M. Bastiaans, Doohee Cho, Irene Battisti, Y.M. Blanter, S. Groeblacher, Milan P. Allan
DOI: https://doi.org/10.1088/1361-6528/ab1c7f
More Info
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Published Date

2019

Language

English

Faculty

Applied Sciences

Department

QN/Quantum Nanoscience

Research Group

QN/Groeblacher Lab

Abstract

We report on the fabrication and performance of a new kind of tip for scanning tunneling microscopy. By fully incorporating a metallic tip on a silicon chip using modern micromachining and nanofabrication techniques, we realize so-called smart tips and show the possibility of device-based STM tips. Contrary to conventional etched metal wire tips, these can be integrated into lithographically defined electrical circuits. We describe a new fabrication method to create a defined apex on a silicon chip and experimentally demonstrate the high performance of the smart tips, both in stability and resolution. In situ tip preparation methods are possible and we verify that they can resolve the herringbone reconstruction and Friedel oscillations on Au(111) surfaces. We further present an overview of possible applications.