An overview of scanning acoustic microscope, a reliable method for non-destructive failure analysis of microelectronic components

Yazdan Mehr, Maryam Yazdan; Bahrami, A.; Fischer, H.; Gielen, Sander; Corbeij, R; van Driel, Williem; Zhang, Guo Qi Z

An overview of scanning acoustic microscope, a reliable method for non-destructive failure analysis of microelectronic components

Conference paper (2015)

Authors

Maryam Yazdan Yazdan Mehr Electronic Components, Technology and Materials

A. Bahrami External organisation

H. Fischer External organisation

Sander Gielen External organisation

R Corbeij External organisation

Williem van Driel Electronic Components, Technology and Materials

Guo Qi Z Zhang Electronic Components, Technology and Materials

Research Group

Electronic Components, Technology and Materials

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Published Date

2015

Language

English

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Research Group

Electronic Components, Technology and Materials

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