Outlook: From Physics of Failure to Physics of Degradation

Book chapter (2022)

Authors

W.D. van Driel Electronic Components, Technology and Materials - EEMCS
M. Yazdan Mehr Electronic Components, Technology and Materials - EEMCS
X. J. Fan Lamar University
Kouchi Zhang Electronic Components, Technology and Materials - EEMCS
Research Group
Electronic Components, Technology and Materials (EEMCS) (TU Delft)
Copyright: © 2022 W.D. van Driel, M. Yazdan Mehr, X. J. Fan, Kouchi Zhang
DOI: https://doi.org/10.1007/978-3-030-81576-9_17
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Published Date

2022

Language

English

Reuse Rights

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Faculty

Electrical Engineering, Mathematics and Computer Science

Department

Microelectronics

Research Group

Electronic Components, Technology and Materials

Abstract

In the foregoing chapters, the reliability of organic compounds in microelectronics and optoelectronics was discussed. It provided a state of the art in reliability concepts for materials used in electronic products. It also enlightened the direction in reliability concepts for these products. In this chapter, we discuss the outlook where we envision that physics of failure will be replaced by physics of degradation. New technologies, like health monitoring and digital twins, are needed to make this foreseen shift in reliability concepts.

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