I Schanstra | TU Delft Repository

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I Schanstra

Conference paper (5)

5 records found

1

Influence of bit line twisting on the faulty behavior or DRAMs

Conference paper (2004) - Z. Al-Ars (author), M Herzog (author), I Schanstra (author), AJ van de Goor (author)

Consequences of RAM bitline twisting for test coverage

Conference paper (2003) - I Schanstra (author), AJ van de Goor (author)

Logical and topological testing of scrambled RAMs

Conference paper (2003) - I Schanstra (author), AJ van de Goor (author)

Address and data scrambling: causes and impact on memory tests

Conference paper (2002) - AJ van de Goor (author), I Schanstra (author)

Industrial evaluation of stress combinations for march tests applied to SRAMs

Conference paper (1999) - I Schanstra (author), AJ van de Goor Ph D (author)