3 records found
1
A 1 × 400 backside-illuminated SPAD sensor with 49.7 ps resolution, 30 pJ/sample TDCs fabricated in 3D CMOS technology for near-infrared optical tomography
Measurement and modeling of microlenses fabricated on single-photon avalanche diode arrays for fill factor recovery
3D near-infrared imaging based on a single-photon avalanche diode array sensor