A 1 × 400 backside-illuminated SPAD sensor with 49.7 ps resolution, 30 pJ/sample TDCs fabricated in 3D CMOS technology for near-infrared optical tomography

Journal article (2015)

Authors

JM Pavia External organisation
M. Scandiuzzo Signal Processing Systems - EEMCS
S. Lindner External organisation
M Wolf External organisation
E. Charbon-Iwasaki-Charbon Signal Processing Systems - EEMCS
Research Group
Signal Processing Systems (EEMCS) (TU Delft)
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Published Date

2015

Language

English

Reuse Rights

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Faculty

Electrical Engineering, Mathematics and Computer Science

Department

Microelectronics

Research Group

Signal Processing Systems