JT

J. Tan

9 records found

Analyzing the radiation degradation of 4-transistor deep submicron technology CMOS image sensors

X-ray radiation effect on CMOS imagers with in-pixel buried-channel source follower

4T CMOS Image Sensor Pixel Degradation due to X-ray Radiation

In-pixel buried-channel source follower in CMOS image sensors exposed to X-ray radiation

Radiation effects on CMOS image sensors due to X-rays

Total ionizing effects on 4-transistor CMOS image sensor pixels

X-ray radiation effects on CMOS image sensor in-pixel devices

Reliability analysis of single grain Si TFT using 2D simulation

2D simulation of hot-carrier-induced degradation and reliability analysis for single grain Si TFTs