MJC van de Homberg | TU Delft Repository

Mv

MJC van de Homberg

Conference paper (7)

Doctoral thesis (1)

Journal article (3)

11 records found

1

Microstructural and electrical properties of resolidified submicron Al lines.

Doctoral thesis (1998) - MJC van de Homberg (author)

Electromigration and l/f noise in single-crystalline, bamboo and polycrystalline Al lines

Conference paper (1998) - MJC van de Homberg (author), Paul F.A. Alkemade (author), P.F.A. Alkemade (author), Paul Alkemade (author), PFA Alkemade (author), P. F.A. Alkemade (author), A.H. Verbruggen (author), AG Dirks (author), E Ochs (author), S Radelaar (author)

Resistance Changes Induced by the Formation of a Single Void/Hillock During Electromigration

Conference paper (1998) - A.H. Verbruggen (author), MJC van de Homberg (author), LC Jacobs (author), AJ Kalkman (author), JR Kraayeveld (author), S Radelaar (author)

l/f noise in mono- and polycrystalline aluminium

Journal article (1998) - MJC van de Homberg (author), A.H. Verbruggen (author), PFA Alkemade (author), P.F.A. Alkemade (author), Paul F.A. Alkemade (author), Paul Alkemade (author), P. F.A. Alkemade (author), S Radelaar (author), E Ochs (author), K Armbruster-Dagge (author), A Seeger (author), H Stoll (author)

Electromigration and 1/f noise in single-crystalline, bamboo and polycrystalline Al lines

Conference paper (1997) - MJC van de Homberg (author), Paul F.A. Alkemade (author), P.F.A. Alkemade (author), Paul Alkemade (author), PFA Alkemade (author), P. F.A. Alkemade (author), A.H. Verbruggen (author), AG Dirks (author), E Ochs (author), S Radelaar (author)

Fabricaton of submicron single-crystalline and bamboo Al lines by recrystallization

Journal article (1997) - MJC van de Homberg (author), A.H. Verbruggen (author), Paul F.A. Alkemade (author), P.F.A. Alkemade (author), Paul Alkemade (author), PFA Alkemade (author), P. F.A. Alkemade (author), AG Dirks (author), JL Hurd (author), S Radelaar (author)

Curved crystal lattice in resolidified submicron Al lines

Journal article (1997) - MJC van de Homberg (author), PFA Alkemade (author), P. F.A. Alkemade (author), Paul F.A. Alkemade (author), P.F.A. Alkemade (author), Paul Alkemade (author), S Radelaar (author), JL Hurd (author), AG Dirks (author)

1/f noise and microsructure in thin aluminium lines

Conference paper (1997) - E Ochs (author), MJC van de Homberg (author), Paul F.A. Alkemade (author), PFA Alkemade (author), P.F.A. Alkemade (author), Paul Alkemade (author), P. F.A. Alkemade (author), K Armbruster (author), A Seeger (author), H Stoll (author), A.H. Verbruggen (author)

Electromigration in short Al lines studied by high-resolution resistance measurement

Conference paper (1997) - A.H. Verbruggen (author), MJC van de Homberg (author), LC Jacobs (author), AJ Kalkman (author), JR Kraayeveld (author), S Radelaar (author)

Current dependence of reversible electromigration induced resistance changes in short Al lines and interpretation of irreversible effects

Conference paper (1996) - A.H. Verbruggen (author), MJC van de Homberg (author), AJ Kalkman (author), JR Kraayeveld (author), AWJ Willemsen (author), S Radelaar (author)

Single-crystalline and bamboo Al lines fabricated by graphoepitaxy

Conference paper (1996) - MJC van de Homberg (author), A.H. Verbruggen (author), PFA Alkemade (author), P.F.A. Alkemade (author), Paul Alkemade (author), Paul F.A. Alkemade (author), P. F.A. Alkemade (author), S Radelaar (author)