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AL
A.T.M. Lenferink
2 records found
1
Authored
Raman micro-spectroscopy for quantitative thickness measurement of nanometer thin polymer films
Journal article (2015) -
BM Liszka
,
A.T.M. Lenferink
,
G.J. Witkamp
,
C Otto
Thermal annealing using ultra-short laser pulses to improve the electrical properties of Al:ZnO thin films
Journal article (2015) -
D Scorticati
,
A Illiberi
,
M.S. Dorenkamper
,
D.F. de Lange
,
C Otto
,
DM Borsa
,
WJ Soppe
,
AJ Huis in 't Veld
,
TC Bor
,
S.W.H. Eijt
,
H. Schut
,
GRBE Romer
,
M. Klein Gunnewiek
,
A.T.M. Lenferink
,
B Kniknie
,
R. Mary Joy
