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2 records found
1
Positron depth profiling of the structural and electronic structure transformations of hydrogenated Mg-based thin films
Journal article (2009) -
Stephan Eijt (author)
,
S.W.H. Eijt (author)
,
SWH Eijt (author)
,
Stephan W.H. Eijt (author)
,
S. W.H. Eijt (author)
,
R Kind (author)
,
S Singh (author)
,
H Schut (author)
,
H. Schut (author)
,
Henk Schut (author)
,
W.J. Legerstee (author)
,
RWA Hendrikx (author)
,
V. Svechnikov (author)
,
RJ Westerwaal (author)
,
Bernard Dam (author)
,
B. Dam (author)
Depth Sensitive Analysis of Si-destabilized MgH2 Thin Films upon Reversible H2-sorption
Report (2008) -
R Kind (author)