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RK
R Kind
2 records found
1
Authored
Positron depth profiling of the structural and electronic structure transformations of hydrogenated Mg-based thin films
Journal article (2009) -
S.W.H. Eijt
,
R Kind
,
S Singh
,
H. Schut
,
W.J. Legerstee
,
RWA Hendrikx
,
V. Svechnikov
,
RJ Westerwaal
,
B. Dam
Depth Sensitive Analysis of Si-destabilized MgH2 Thin Films upon Reversible H2-sorption
Report (2008) -
R Kind
