Positron depth profiling of the structural and electronic structure transformations of hydrogenated Mg-based thin films

Journal article (2009)

Authors

S.W.H. Eijt RST/Fundamental Aspects of Materials and Energy - AS
R Kind External organisation
S Singh RST/Fundamental Aspects of Materials and Energy - AS
H. Schut RST/Neutron and Positron Methods in Materials - AS
W.J. Legerstee RST/Fundamental Aspects of Materials and Energy - AS
RWA Hendrikx External organisation
RJ Westerwaal External organisation
B. Dam ChemE/Materials for Energy Conversion and Storage - AS
Research Group
RST/Fundamental Aspects of Materials and Energy (AS) (TU Delft)
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Published Date

2009

Language

Undefined/Unknown

Reuse Rights

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Faculty

Applied Sciences

Department

RST/Radiation, Science and Technology

Research Group

RST/Fundamental Aspects of Materials and Energy