Positron depth profiling of the structural and electronic structure transformations of hydrogenated Mg-based thin films

Journal article (2009)

Authors

Stephan W.H. Eijt RST/Fundamental Aspects of Materials and Energy
R Kind External organisation
S Singh RST/Fundamental Aspects of Materials and Energy
H. Schut RST/Neutron and Positron Methods in Materials
W.J. Legerstee RST/Fundamental Aspects of Materials and Energy
RWA Hendrikx External organisation
RJ Westerwaal External organisation
B. Dam ChemE/Materials for Energy Conversion and Storage
Research Group
RST/Fundamental Aspects of Materials and Energy
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Published Date

2009

Language

Undefined/Unknown

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Research Group

RST/Fundamental Aspects of Materials and Energy

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