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M Vojs
Academic Work (1)
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Electrical transport mechanisms in amorphous/crystalline silicon heterojunction: Impact of passivation layer thickness
Journal article (2014) -
M Mikolášek (author)
,
M Nemec (author)
,
M Vojs (author)
,
V Jakaboviča (author)
,
V Řeháček (author)
,
D. Zhang (author)
,
M. Zeman (author)
,
L Harmatha (author)
