Electrical transport mechanisms in amorphous/crystalline silicon heterojunction: Impact of passivation layer thickness

Journal article (2014)

Authors

M Mikolášek External organisation
M Nemec External organisation
M Vojs External organisation
V Jakaboviča External organisation
V Řeháček External organisation
D. Zhang Electronic Components, Technology and Materials - EEMCS
M. Zeman Photovoltaic Materials and Devices - EEMCS
L Harmatha External organisation
Research Group
Electronic Components, Technology and Materials (EEMCS) (TU Delft)
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Published Date

2014

Language

English

Reuse Rights

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Faculty

Electrical Engineering, Mathematics and Computer Science

Department

Microelectronics

Research Group

Electronic Components, Technology and Materials