With the popularity and widespread application of high-power light-emitting diode (LED) in lighting industry, its reliability has gradually become one of research focuses.The failure of gold bonding wires in the traditional LED package has been a critical bottleneck that restricts its reliability. In this paper, the failure mechanism of LED under cyclically electrical loading is firstly identified through both gold bonding wire mechanical simulation and power cycling test experiment, which is the fatigue fracture of gold bonding wire. Then, two lifetime prediction methods, the acceleration factor extraction method based on current acceleration model and the strain-based Coffin-Manson analytical method, are established and verified with experimental results. The results show that the lifetime prediction accuracy of the proposed methods is high and they can achieve a fast and accurate reliability assessment for high-power LEDs with wire-bonding packaging technology.

As one of solid state lighting sources, wafer-level chip scale Light Emitting Diode (LED) packages has gained much attention, because of its compact size, high power and high optical performance. For this package to be effective, the solder layer plays the critical role in heat dissipation, mechanical support and electrical conductivity. Among all types of solder materials, Sn-3.0Ag-0.5Cu (SAC305) solder alloy is considered as one of best chip-attachment candidates due to its acceptable cost, good solderability, and favorable shear strength. However, such solder connections are prone to fatigue over time due to thermal or power cycling. This paper models the wafer level chip scale LEDs soldered on both aluminum oxide and aluminum substrates with SAC305 solder alloy. Thermal cycling conditions are simulated to assess the fatigue damage of the solder interconnection. Von Mises stress and plastic work density are utilized to represent the fatigue damage per cycle by using finite element analysis (FEA) method. Important design considerations include the effects of LED chip substrate, thickness of the solder interconnections, void ratio in the solder connections and PCB substrate. The result is a set of fatigue damage accumulation metrics.

Due to low power consumption, long lifetime and many other advantages, Light-emitting Diode (LED) has increased dramatically all over the world. Chip Scale Package (CSP) LED is a new LED package with small size, high current, and high reliability. For the CSP LED with smaller size and lower thermal resistance, phosphors and silicone are usually combined as the phosphors/silicone composite and prepared by using a high temperature cure process. However, for those CSPs which are not sufficiently cured, their reliability under a harsh environment (e.g. high temperatures and high humidity) will obviously decrease. In this study, the influence of temperature and ultraviolet light on the cure process of phosphor/silicone composites is studied and an optimal cure process is extracted accordingly. According to the cure experiment under different conditions, the results show that ultraviolet light and phosphor can promote the cure reaction of silicone. With the increase of ultraviolet light intensity and phosphor mass fraction, the cure rate of the silicone and phosphor/silicone composite is greatly increased as well.