Analysis of the impact of spatial and temporal variations on the stability of SRAM arrays and the mitigation technique using independent-gate devices

Aging assessment and reliability aware omputing platforms

Lifetime reliability assessment with aging information from low-level sensors

Variation tolerant on-chip degradation sensors for dynamic reliability management systems

Statistical reliability analysis of NBTI impact on FinFET SRAMs and mitigation technique using independent-gate devices

A Uni¿ed Aging Model of NBTI and HCI Degradation towards Lifetime Reliability Management for Nanoscale MOSFET Circuits

A Novel Virtual Age Reliability Model for Time-toFailure Prediction