Statistical reliability analysis of NBTI impact on FinFET SRAMs and mitigation technique using independent-gate devices

Conference paper (2012)

Authors

Y. Wang Computer Engineering - EEMCS
S.D. Cotofana Computer Engineering - EEMCS
L Fang External organisation
Research Group
Computer Engineering (EEMCS) (TU Delft)
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Published Date

2012

Language

English

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Faculty

Electrical Engineering, Mathematics and Computer Science

Department

Quantum & Computer Engineering

Research Group

Computer Engineering