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I Koren
Academic Work (1)
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A combined design-time/test-time study of the vulnerability of sub-threshold devices to low voltage fault attacks
Journal article (2014) -
A Barenghi (author)
,
C Hocquet (author)
,
D Bol (author)
,
FX Standaert (author)
,
F. Regazzoni (author)
,
I Koren (author)
