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WJ Eysenga
Academic Work (10)
Conference paper (5)
Report (5)
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10 records found
1
Parameter calibration on post-implantation dopant diffusion
Conference paper (2004) -
J Fu (author)
,
W Crans (author)
,
WJ Eysenga (author)
Weer woord op het protocol van proposal DET 5788
Report (2002) -
W Crans (author)
,
WJ Eysenga (author)
Varying characteristics of bipolar transistors with emitter contact window width
Conference paper (2001) -
J Fu (author)
,
S Mijalkovic (author)
,
WJ Eysenga (author)
,
H.W. van Zeijl (author)
,
W Crans (author)
Parameter calibration for dopant post-implant diffusion
Conference paper (2001) -
J Fu (author)
,
WJ Eysenga (author)
,
W Crans (author)
Varying characteristics of bipolar transistors with emitter contact window width
Conference paper (2001) -
J Fu (author)
,
S Mijalkovic (author)
,
WJ Eysenga (author)
,
H.W. van Zeijl (author)
,
W Crans (author)
Improving the speed performance of large scale TCAD simulators for microelectronics by multygrid and parallelisation - DEL 5672
Report (2001) -
W Crans (author)
,
WJ Eysenga (author)
Improving the performance of process stimulators by multigrid (MG) methods and parallelisation. Half yearly report, working period: Jan. - June 2000 [confidential]
Report (2000) -
W Crans (author)
,
WJ Eysenga (author)
,
S Mijalkovic (author)
The influence of mechanical stresses on the characteristics of bipolar transistors
Conference paper (2000) -
F Jun (author)
,
S Mijalkovic (author)
,
WJ Eysenga (author)
,
H.W. van Zeijl (author)
,
W Crans (author)
Improving the performance of process simulators by multigrid (MG) methods and parallelisation. Half-yearly report: January-June 1999 [vertrouwelijk]
Report (1999) -
W Crans (author)
,
WJ Eysenga (author)
,
S Mijalkovic (author)
,
J.M. Thijssen (author)
Improving the performance of process simulators by multigrid (MG) methods and parallelisation. Annual report: September-December 1998 [vertrouwelijk]
Report (1999) -
W Crans (author)
,
WJ Eysenga (author)
,
S Mijalkovic (author)
,
J.M. Thijssen (author)