Varying characteristics of bipolar transistors with emitter contact window width

Fu, J; Mijalkovic, S; Eysenga, WJ; van Zeijl, H.W.; Crans, W

Varying characteristics of bipolar transistors with emitter contact window width

Conference paper (2001)

Authors

J Fu Electronic Components, Technology and Materials -

S Mijalkovic Old - EWI Ch. Integrated Sensing Devices

WJ Eysenga Electronic Components, Technology and Materials -

H.W. van Zeijl Electronic Components, Technology and Materials -

W Crans Electronic Components, Technology and Materials -

Research Group

Electronic Components, Technology and Materials () (TU Delft)

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Published Date

2001

Language

Undefined/Unknown

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Faculty

Electrical Engineering, Mathematics and Computer Science

Department

Microelectronics

Research Group

Electronic Components, Technology and Materials