Stress development and adhesion behavior in thin ceramic coatings monitored by positron annihilation during bending

Conference paper (2002)

Authors

R Escobar Galindo Old - Section Defects in Materials
A van Veen Old - Section Defects in Materials
Henk Schut Old - Section Defects in Materials
NJM Carvalho External organisation
C Strondl External organisation
ThM Hosson External organisation
Research Group
Old - Section Defects in Materials
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Published Date

2002

Language

Undefined/Unknown

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Research Group

Old - Section Defects in Materials

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