A positron beam 2D-ACAR definitive proof of electric-field-assisted positron drift in SiO2 layers: Application to the study of the Si/SiO2 interface

Rivera, A; van Veen, A; Falub, CV; Eijt, S. W.H.; Schut, Henk; de Nijs, JMM; Balk, P

A positron beam 2D-ACAR definitive proof of electric-field-assisted positron drift in SiO2 layers: Application to the study of the Si/SiO2 interface

Conference paper (2003)

Authors

A Rivera Old - Section Defects in Materials

A van Veen Old - Section Defects in Materials

CV Falub Old - Section Defects in Materials

S. W.H. Eijt Old - Section Defects in Materials

Henk Schut Old - Section Defects in Materials

JMM de Nijs External organisation

P Balk External organisation

Research Group

Old - Section Defects in Materials

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Published Date

2003

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Research Group

Old - Section Defects in Materials

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