Extended Nijboer-Zernike (ENZ) based evaluation of amplitude and phase aberrations on scaled and annual pupils.

van Haver, S.; Janssen, AJEM; Dirksen, P.; Braat, J.J.M.

Extended Nijboer-Zernike (ENZ) based evaluation of amplitude and phase aberrations on scaled and annual pupils.

Conference paper (2007)

Authors

S. van Haver ImPhys/Optics

AJEM Janssen External organisation

P. Dirksen External organisation

J.J.M. Braat ImPhys/Optics

Research Group

ImPhys/Optics

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Published Date

2007

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Research Group

ImPhys/Optics

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