The nanostructural analysis of hydrogenated silicon films based on positron annihilation studies

Melskens, Jimmy; Smets, A.H.M.; Eijt, S. W.H.; Schut, H; Bruck, E.; Zeman, M

The nanostructural analysis of hydrogenated silicon films based on positron annihilation studies

Journal article (2012)

Authors

Jimmy Melskens Photovoltaic Materials and Devices

A.H.M. Smets Photovoltaic Materials and Devices

S. W.H. Eijt RST/Fundamental Aspects of Materials and Energy

H Schut RST/Neutron and Positron Methods in Materials

E. Bruck RST/Fundamental Aspects of Materials and Energy

M Zeman Photovoltaic Materials and Devices

Research Group

Photovoltaic Materials and Devices

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Published Date

2012

Language

English

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Research Group

Photovoltaic Materials and Devices

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