Surface contamination induced resonance frequency shift of cantilevers

Conference paper (2009)

Authors

H Sadeghian External organisation
C. Yang Electronic Instrumentation - EEMCS
K Babaei Gavan QN/Mol. Electronics & Devices
J.F.L. Goosen Electronic Instrumentation - EEMCS
E.W.J.M. van der Drift QN/Kavli Nanolab Delft - AS
H.S.J. van der Zant QN/Mol. Electronics & Devices
P.J. French Electronic Instrumentation - EEMCS
A. Bossche Electronic Instrumentation - EEMCS
A. van Keulen Computational Design and Mechanics - Mechanical, Maritime and Materials Engineering
Research Group
Electronic Instrumentation (EEMCS) (TU Delft)
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Published Date

2009

Language

Undefined/Unknown

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Faculty

Electrical Engineering, Mathematics and Computer Science

Department

Microelectronics

Research Group

Electronic Instrumentation