Depth-selective 2D-ACAR studies on low-k dielectric thin film S Radiation physics and chemistry

Eijt, S. W.H.; van Veen, A; Falub, CV; Escobar Galindo, R; Schut, Henk; Mijnarends, P.E.

Depth-selective 2D-ACAR studies on low-k dielectric thin film S Radiation physics and chemistry

Journal article (2003)

Authors

S. W.H. Eijt Old - Section Defects in Materials

A van Veen Old - Section Defects in Materials

CV Falub Old - Section Defects in Materials

R Escobar Galindo Old - Section Defects in Materials

Henk Schut Old - Section Defects in Materials

P.E. Mijnarends Old - Section Defects in Materials

Research Group

Old - Section Defects in Materials

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Published Date

2003

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Research Group

Old - Section Defects in Materials

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