Characterization of AlN thin films sputtered on Al Ti electrodes for piezoelectric devices

Tran, A.T.; Schellevis, H.; Shen, C.; Pham, HTM; Sarro, Pasqualina M

Characterization of AlN thin films sputtered on Al Ti electrodes for piezoelectric devices

Conference paper (2010)

Authors

A.T. Tran Electronic Components, Technology and Materials -

H. Schellevis Electronic Components, Technology and Materials -

C. Shen Electronic Components, Technology and Materials -

HTM Pham Old - EWI Sect. ECTM

Pasqualina M Sarro Electronic Components, Technology and Materials -

Research Group

Electronic Components, Technology and Materials () (TU Delft)

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http://resolver.tudelft.nl/uuid:6faed644-6405-454b-9dd0-5d8c9e9958f2

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Published Date

2010

Language

English

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Faculty

Electrical Engineering, Mathematics and Computer Science

Department

Microelectronics

Research Group

Electronic Components, Technology and Materials