Two Reliability Regimes for Cybersecurity and Their Implications for Government

Conference paper (2006)

Authors

M.J.G. van Eeten Organisation & Governance - TPM
M Kars Organisation & Governance - TPM
H.G. van der Voort Organisation & Governance - TPM
R van der Luit External organisation
J.A. de Bruijn Organisation & Governance - TPM
Research Group
Organisation & Governance (TPM) (TU Delft)
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Published Date

2006

Language

Undefined/Unknown

Reuse Rights

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Faculty

Technology, Policy and Management

Department

Multi Actor Systems

Research Group

Organisation & Governance