Reverse biasing and breakdown behavior of PureB diodes

Qi, L.; Mok, KRC; Aminian, M; Scholtes, T.L.M.; Charbon, Edoardo; Nanver, L. K.

Reverse biasing and breakdown behavior of PureB diodes

Conference paper (2013)

Authors

L. Qi Electronic Components, Technology and Materials -

KRC Mok External organisation

M Aminian External organisation

T.L.M. Scholtes Electronic Components, Technology and Materials -

Edoardo Charbon Signal Processing Systems -

L. K. Nanver Electronic Components, Technology and Materials -

Research Group

Electronic Components, Technology and Materials () (TU Delft)

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http://resolver.tudelft.nl/uuid:1a5ce167-f017-4a33-87ef-9088ab40e6d6

More Info

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Published Date

2013

Language

English

Reuse Rights

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Faculty

Electrical Engineering, Mathematics and Computer Science

Department

Microelectronics

Research Group

Electronic Components, Technology and Materials