Comparison between amorphous hydrogenated silicon deposited by glow discharge and hot wire methods by means of positron studies

Report (2000)

Authors

A Rivera Old - Section Defects in Materials
H. Schut Old - Section Defects in Materials
S.W.H. Eijt Old - Section Defects in Materials
A van Veen Old - Section Defects in Materials
Research Group
Old - Section Defects in Materials
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Published Date

2000

Language

Undefined/Unknown

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Research Group

Old - Section Defects in Materials