X-ray nanodiffraction on a single SiGe quantum dot inside a functioning field-effect transistor

Journal article (2011)

Authors

N Hrauda External organisation

J. Zhang Electronic Components, Technology and Materials

E Wintersberger External organisation

T Etzelstorfer External organisation

B Mandl External organisation

J Stangl External organisation

D Carbone External organisation

V Holy External organisation

V. Jovanovic Electronic Components, Technology and Materials

C Biasotto Electronic Components, Technology and Materials

L. K. Nanver Electronic Components, Technology and Materials

J Moers External organisation

D Grutzmacher External organisation

G Baur External organisation

Research Group

Electronic Components, Technology and Materials

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Published Date

2011

Language

English

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Research Group

Electronic Components, Technology and Materials

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