Magnetic focusing of an intense slow positron beam for enhanced depth-resolved analysis of thin films and interfaces

Falub, CV; Eijt, S.W.H.; Mijnarends, P.E.; Schut, H.; van Veen, A

Magnetic focusing of an intense slow positron beam for enhanced depth-resolved analysis of thin films and interfaces

Journal article (2002)

Authors

CV Falub Old - Section Defects in Materials

S.W.H. Eijt Old - Section Defects in Materials

P.E. Mijnarends Old - Section Defects in Materials

H. Schut Old - Section Defects in Materials

A van Veen Old - Section Defects in Materials

Research Group

Old - Section Defects in Materials

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Published Date

2002

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Research Group

Old - Section Defects in Materials