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NV Loukianova

Journal article (1)

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1

Leakage current modeling of test structures for characterization of dark current in CMOS image sensors

Journal article (2003) - NV Loukianova (author) , H-O Folkerts (author) , JPV Maas (author) , DWE Verbugt (author) , AJ Mierop (author) , W Hoekstra (author) , E Roks (author) , A.J.P.A.M. Theuwissen (author)