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WH
W Hoekstra
Academic Work (1)
Journal article (1)
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Leakage current modeling of test structures for characterization of dark current in CMOS image sensors
Journal article (2003) -
NV Loukianova (author)
,
H-O Folkerts (author)
,
JPV Maas (author)
,
DWE Verbugt (author)
,
AJ Mierop (author)
,
W Hoekstra (author)
,
E Roks (author)
,
A.J.P.A.M. Theuwissen (author)
