We describe the state of the development of a coherence scanning interferometer to measure local changes in topology and local induced vibrations of a mirror at cryogenic temperatures. The metrology instrument incorporates an optical phase mask and a microlenses array, enabling the acquisition of complete white light interferograms within a single-camera frame. This stands in contrast to traditional temporal phase-shifting interferometers. We design the optical phase mask as a combination of steps of different thicknesses, so each step introduces a different optical path difference to the rays. The local interferograms for each camera frame provide us with information on the local topology of the mirror. The interferogram displacement between camera frames allows us to monitor the mirror’s local induced vibrations. In this work, we report the metrology instrument’s working principle through numerical simulations and present the latest results of a proof of concept developed at the laboratory. The metrology instrument shown is of extensive usability in diverse applications related to real-time measurements of various fast physical processes and real-time characterization of the optical components topology.@en

The diffractive zone thicknesses of conventional diffractive optical elements (DOEs) are generally obtained using the thin element approximation (TEA). However, the TEA yields inaccurate results in the case of thick multilayer DOEs (MLDOEs). The extended scalar theory (EST) is an alternative thickness optimization method that depends on the diffractive order and the optimization wavelength. We developed an algorithm to research suitable EST input parameters. It combines ray-tracing and Fourier optics to provide a performance estimate for each EST parameter pair. The resulting “best”MLDOEdesigns for three different material combinations are analyzed using rigorous finite-difference time-domain. Compared to the TEA, the proposed algorithm can provide performing zone thicknesses. @en

We present the experimental results of the proof of concept of a metrology instrument developed to characterize the cryogenic mirror of the Einstein Telescope (ET) prototype. ET is a proposed gravitational-wave observatory. The metrology instrument uses the principle of low-coherence interferometry to measure the local change in topology and local induced vibrations of the mirror resulting from the cooling down process. We implement an innovative optical phase mask and a microlens array to obtain a depth map of the mirror on a single camera frame. With our instrument prototype, we can obtain 25 interference patterns of the same mirror spot for each camera frame. Each interference pattern corresponds to a difference Optical Path Difference (OPD). Then by reconstructing the interference patterns, we can measure the mirror’s local topology change and local induced vibration. Moreover, in this proceeding, we describe the analysis of the white-light interference patterns through numerical simulations and depict the metrology instrument’s optical design. Finally, we discuss how we can use the metrology instrument for real-time characterization of other optical components with all the advantages of white light interferometry. @en

The polychromatic integral diffraction efficiency (PIDE) metric is generally used to select the most suitable materials for multilayer diffractive optical elements (MLDOEs). However, this method is based on the thin element approximation, which yields inaccurate results in the case of thick diffractive elements such as MLDOEs. We propose a new material selection approach, to the best of our knowledge, based on three metrics: transmission, total internal reflection, and the optical component’s total thickness. This approach, called “geometric optics material selection method” (GO-MSM), is tested in mid-wave and long-wave infrared bands. Finite-difference time-domain is used to study the optical performance (Strehl ratio) of the “optimal” MLDOE combinations obtained with the PIDE metric and the GO-MSM. Only the proposed method can provide MLDOE designs that perform. This study also shows that an MLDOE gap filled with a low index material (air) strongly degrades the image quality.@en