Ultraviolet photoelectron spectroscopy (UPS) is a key technique to determine the work function (Φ) of surfaces by measuring the secondary-electron cut-off (SECO). However, the interpretation of SECO spectra as obtained by UPS is not straightforward for multicomponent surfaces, and it is not comprehensively understood to what extent the length scale of inhomogeneity impacts the SECO. Here, this study unravels the physics governing the energy distribution of the SECO by experimentally and theoretically determining the electrostatic landscape above surfaces with defined patterns of Φ. For such samples, the measured SECO spectra exhibit actually two cut-offs, one representing the high Φ surface component and the other one corresponding to an area-averaged Φ value. By combining Kelvin probe force microscopy and electrostatic modeling, it is quantitatively demonstrated that the electrostatic potential of the high Φ areas leads to an additional energy barrier for the electrons emitted from the low Φ areas. Theoretical predictions of the induced energy barrier dependence on the Φ-pattern length scale and sample bias are further experimentally verified. These findings establish a solid base for reliable SECO interpretation of heterogeneous surfaces and improved reliability of interfacial energy-level diagrams from UPS experiments.