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RWE van de Kruijs
Academic Work (3)
Conference paper (1)
Journal article (2)
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3 records found
1
Surface oxide content examination of capping boron layers in UV photodetectors
Conference paper (2015) -
Vahid Mohammadi (author)
,
V. Mohammadi (author)
,
P. Rao (author)
,
P. Ramachandra Rao (author)
,
Padmakumar R. Ramachandra Rao (author)
,
Padmakumar R. Rao (author)
,
RWE van de Kruijs (author)
,
S. Nihtianov (author)
,
Stoyan Nihtianova (author)
,
Stoyan Nihtianova (author)
,
S Nihitanov (author)
,
S Nihtianova (author)
,
S. Nihtianova (author)
,
Stoyan Nihtianov (author)
,
Stoyan Nihitanov (author)
,
S. Nihitanov (author)
,
S Nihtianov (author)
,
Stoyan Nihtianov (author)
,
Stoyan Nihitanov (author)
Chemical interaction of B4C, B, and C with Mo/Si layered structures
Journal article (2010) -
VITA de Rooij-Lohmann (author)
,
LW Veldhuizen (author)
,
E Zoethout (author)
,
AE Yakshin (author)
,
RWE van de Kruijs (author)
,
B. J. Thijsse (author)
,
BJ Thijsse (author)
,
B.J. Thijsse (author)
,
Barend J. Thijsse (author)
,
M Gorgoi (author)
,
F Schafers (author)
,
F Bijkerk (author)
,
F. Bijkerk (author)
Interface roughness in Mo/Si multilayers
Journal article (2006) -
I Nedelcu (author)
,
RWE van de Kruijs (author)
,
AE Yakshin (author)
,
F.D. Tichelaar (author)
,
F. Tichelaar (author)
,
FD Tichelaar (author)
,
F. D. Tichelaar (author)
,
Frans D. Tichelaar (author)
,
Frans Tichelaar (author)
,
E Zoethout (author)
,
E Louis (author)
,
H Enkisch (author)
,
S Muellender (author)
,
F Bijkerk (author)
,
F. Bijkerk (author)