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EF
EM Franken
3 records found
1
Authored
Quantifying resolution limiting factors in subtomogram averaged cryo-electron tomography using simulations
Journal article (2014) -
L.M. Voortman
,
M. Vulovic
,
M Maletta
,
A Voigt
,
EM Franken
,
A Simonetti
,
PJ Peters
,
L.J. van Vliet
,
B. Rieger
Precise and unbiased estimation of astigmatism and defocus in transmission electron microscopy
Journal article (2012) -
M. Vulovic
,
EM Franken
,
RBG Ravelli
,
L.J. van Vliet
,
B. Rieger
Fast, spatially varying CTF correction in TEM
Journal article (2012) -
L.M. Voortman
,
EM Franken
,
L.J. van Vliet
,
B. Rieger