SK
S. Kuiper
10 records found
1
Piezoelectric tube scanners are commonly used in Scanning Probe Microscopy (SPM) to provide the scanning motion of the tip or sample. Oscillations due to the weakly damped resonances of the scanner are a major souce of image distortion in SPM-imaging. In this contribution, multip
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Piezoelectric tube scanners are typically used in atomic force microscopy (AFM) to prove the scanning motion of the sample. Excitation of the weakly damped fundamental resonance of the tube scanner leads to oscillations that can cause severe image distortion. This paper presents
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