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L.Y Chang
1 records found
1
Authored
The benefits of statistical parameter estimation theory for quantitative interpretation of electron microscopy data
Book chapter (2008) -
S. Van Aert
,
S Bals
,
L.Y Chang
,
A.J. den Dekker
,
A.I Kirkland
,
D Van Dijck
,
Gustaaf Van Tendeloo
