The benefits of statistical parameter estimation theory for quantitative interpretation of electron microscopy data

Book chapter (2008)

Authors

S. Van Aert External organisation
S Bals External organisation
L.Y Chang External organisation
A.J. den Dekker Team Michel Verhaegen - Mechanical, Maritime and Materials Engineering
A.I Kirkland External organisation
D Van Dijck External organisation
Gustaaf Van Tendeloo Universiteit Antwerpen
Research Group
Team Michel Verhaegen (Mechanical, Maritime and Materials Engineering) (TU Delft)
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Published Date

2008

Language

Undefined/Unknown

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Faculty

Mechanical, Maritime and Materials Engineering

Department

Delft Center for Systems and Control

Research Group

Team Michel Verhaegen